In the task of integrated circuit micrograph acquisition, image super-resolution reconstruction technology can significantly enhance acquisition efficiency. With the advancement of deep learning techniques, the performance of image super-resolution reconstruction networks has improved markedly, but their demand for inference device memory has also increased substantially, greatly limiting their practical application in engineering and deployment on resource-constrained devices. Against this backdrop, we designed image super-resolution reconstruction networks based on feature reuse and structural reparameterization techniques, ensuring that the networks maintain reconstruction performance while being more suitable for deployment in resource-limited environments. Traditional image super-resolution reconstruction networks often redundantly compute similar features through standard convolution operations, leading to significant computational resource wastage. By employing low-cost operations, we replaced some redundant features with those generated from the inherent characteristics of the image and designed a reparameterization layer using structural reparameterization techniques. Building upon local feature fusion and local residual learning, we developed two efficient deep feature extraction modules, and forming the image super-resolution reconstruction networks. Compared to performance-oriented image super-resolution reconstruction networks (e.g., DRCT), our network reduces algorithm parameters by 84.5% and shortens inference time by 49.8%. In comparison with lightweight image reconstruction algorithms, our method improves the mean structural similarity index by 3.24%. Experimental results demonstrate that the image super-resolution reconstruction network based on feature reuse and structural reparameterization achieves an excellent balance between network performance and complexity.
Li et al. (Sat,) studied this question.