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The statistics of electron transport in a tunnel junction is affected by fluctuations of its voltage bias, which modulates the probability for electrons to cross the junction. We exploit this phenomenon to provide a direct measurement of quantum vacuum fluctuations in the microwave domain of a resistor placed at ultra-low temperature: we show that the amplified vacuum fluctuations are correlated with the noise generated by the junction to contribute to a third moment of detected voltage fluctuations. This experiment constitutes an absolute measurement of noise, not affected by the unavoidable noise added by the detection setup.
Farley et al. (Tue,) studied this question.
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