To accurately quantify pore pressure uncertainty and associated kick risk, this paper proposes a dual-phase pre-drilling risk assessment framework based on Bayesian Long Short-Term Memory (BLSTM) networks, integrating formation pressure prediction with distribution interference analysis. First, the effects of two Bayesian layer optimization methods—Monte Carlo dropout and Bayes-by-Backprop—on deep learning networks were systematically evaluated. The optimized Bayes-by-Backprop-LSTM model was subsequently selected for uncertainty prediction of formation pore pressure. Finally, kick risk was quantified by analyzing the interference between predicted pressure distributions and the safety margin of designed drilling mud density. The BLSTM models uncertainty regression between well-log parameters and formation pore pressure labels. Using the Bayes-by-Backprop strategy, it generates probabilistic pressure predictions. By incorporating the designed drilling mud density of target wells, kick risk probability is calculated through distribution interference criteria, where the overlapping area between pore pressure distributions and mud density safety boundaries is mapped to risk probability. Validation experiments utilized five types of well-log parameters from three wells in EAST CHINA. Key results demonstrate: (1) The BLSTM regression model achieved a mean absolute error (MAE) of 0.037 on test wells, representing a 26.7% reduction compared to conventional LSTM, with the 95% confidence interval coverage reaching 69.6%. (2) In the 3893–4048 m interval of a test well, interference areas exceeding thresholds indicated 60% kick risk probability. Spatial correlation with actual kick events revealed risk points undetectable by conventional pore pressure prediction methods. This study establishes a comprehensive risk assessment paradigm encompassing pore pressure uncertainty regression prediction and probabilistic risk calculation, providing drilling engineering with a framework that combines physical interpretability and statistical reliability.
Xia et al. (Sat,) studied this question.