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Biaxial membrane stress evolution during pellicle mounting and stabilization in semiconductor manufacturing | Synapse
March 3, 2026
Biaxial membrane stress evolution during pellicle mounting and stabilization in semiconductor manufacturing
YL
Yu Ching Lee
NH
Nai Hsiang Hsing
YZ
Yu Xiang Zhang
Ningbo University
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Key Points
Biaxial stress demonstrates significant variation during the pellicle mounting process, affecting product quality.
Key measurements indicate that stress levels can exceed tolerance thresholds under specific conditions.
Observational analysis examines membrane properties throughout the mounting and stabilization phases in production.
Understanding these stress factors may enable improvements in manufacturing processes and yield stability.
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Lee et al. (Wed,) studied this question.
synapsesocial.com/papers/69a7619cc6e9836116a2fa5e
https://doi.org/https://doi.org/10.1016/j.measurement.2026.120880