Characterization of a New Zircon Reference Material (TGZ) with Substantial Reserve for In-Situ U-Pb and Hf-O Isotope Analysis

Key Points

• The research aims to characterize a new zircon reference material for U-Pb and Hf-O isotope analysis.
• Utilized laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS).
• Employed secondary ion mass spectrometry (SIMS)
• Analyzed U-Pb ages and Hf-O isotopic compositions.
• Provided complementary constraints on crustal evolution.
• Revealed significant potential for future geological applications.