To ensure reliable signal transmission of electrical connectors under long-term storage conditions, this study selected a specific type of electrical connector, a phenolic resin insulator, as the subject of investigation. An expression for the insulation resistance of an electrical connector was first established based on the failure mechanism of phenolic resin insulators in storage environments. Expressions for electrical conductivity under temperature and humidity stresses were derived by integrating principles from dielectric physics, electrochemistry, molecular dynamics, and the law of mass action. Subsequently, a degradation model for the insulation performance of the phenolic resin was established. Accelerated degradation tests were conducted using temperature and humidity as acceleration stresses, and the test data were analyzed. Finally, through data fitting, the degradation law of the insulation performance of the electrical connectors under long-term storage conditions was established.
Han et al. (Thu,) studied this question.