Compact models of transistors are essential for simulating and optimizing circuits with the use of SPICE simulation tool. Parameter extraction, which is calibrating these models, is essential to ensure their alignment with measured or simulated data. However, conventional parameter extraction methods are generally iterative and experience-dependent, requiring significant time and effort from modeling engineers. Moreover, as semiconductor devices and compact models become increasingly advanced, the need for a tailored extraction process for each model has become increasingly inefficient. To address the above challenges, this work proposes an agile transistor compact modeling framework, ATMAD. The proposed framework takes a compact model file and a set of electrical characteristic data as inputs, producing a calibrated model with minimal human intervention. ATMAD automatically retrieves the equations in the compact model and converts them into computational flow graphs, thus supporting different compact models with a generalized process. A graph unlooping technique is proposed to support automatic differentiation for compact models with implicit functions (e.g., series resistance and surface potential solving). Based on the computational flow graph, ATMAD adopts automatic differentiation technique to achieve automatic and parallel optimization of model parameters. The proposed ATMAD framework is validated on commonly-used compact models in academia and industry, showing its effectiveness for compact modeling for both I-V and C-V characteristics.
Zhang et al. (Fri,) studied this question.