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Abstract Synchrotron‐based energy resolved XPS was used to characterize the structure of IrO 2 RuO 2 ‐coated Sb 2 O 5 SnO 2 nanoparticles. Samples were heat treated at 300, 350, 400, 450 and 500 °C after chloride Ir and Ru precursors were added to Sb 2 O 5 SnO 2 . Photoelectron kinetic energies of 100, 350 and 1400 eV were employed to obtain an indication of the depth of elemental distributions and chemical shifts. It was shown that the electrocatalyst consists of a core of Sb 2 O 5 SnO 2 enriched with Sb 2 O 5 towards the surface, with a shell of IrO 2 RuO 2 deposited on this core, and an outer layer of Sb 2 O 5 SnO 2 over this shell. No significant chemical interaction occurs between IrO 2 RuO 2 and Sb 2 O 5 SnO 2 . The energy resolved XPS depth profile technique is effective for studying core‐shell materials. Copyright © 2010 John Wiley & Sons, Ltd.
Haverkamp et al. (Mon,) studied this question.