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The standard procedure for measuring 14 C at the Gif-sur-Yvette Tandetron AMS facility is described. A new sample manipulator and automated measurements are being used and have been operational for six months. Evidence of isotopic fractionation in the sputter ion source is provided. We take this into account by measuring the 13 C/ 12 C ratio of the sample in the accelerator.
Arnold et al. (Sun,) studied this question.
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