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Images of a woven fabric with missing picks are digitized, and three different image analysis techniques are compared: the Sobel edge operator, the fast Fourier transform, and the discrete wavelet transform. The wavelet transform, used as a multi-resolution spectral filter, is able to give both spectral and frequency information about a fabric. For the samples tested, the wavelet transform can characterize defects due to missing picks and ends faster and more accurately than the other methods.
Jasper et al. (Wed,) studied this question.