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Abstract Scintillators are widely utilized as X‐ray imaging detectors. Pixelated scintillator films with optical‐waveguide‐effect are preferred to realize high‐resolution X‐ray imaging. However, it remains a great challenge to rapidly fabricate high‐resolution pixelated scintillator film. Herein, a new strategy is developed to solve the problem by embedding metal halide scintillators into an anodic aluminum oxide (AAO) via a facile hot‐pressing method. Cs 3 Cu 2 I 5 is selected as the prototype to fabricate pixelated scintillator films with targeted thickness, denoted as Cs 3 Cu 2 I 5 −AAO. The light confinement effect provided by AAO is validated by finite‐difference time‐domain simulations. In particular, the as‐prepared Cs 3 Cu 2 I 5 −AAO film demonstrates higher spatial resolution (10.4 lp mm −1 at modulation transfer function = 0.2), higher UV and X‐ray imaging performances compared to the homogeneous counterpart and commercialized terbium‐doped gadolinium oxysulfide. These results can inspire further research on the design of nanostructured metal halide perovskites for high‐resolution X‐ray imaging.
Zhao et al. (Fri,) studied this question.