In this work, a NiO/β-Ga2O3 heterojunction diode with an ultrathin (∼2 nm) amorphous boron nitride (a-BN) interfacial layer (IL) is presented. The NiO/a-BN/β-Ga2O3 heterojunction diode exhibited a lower turn-on voltage and a higher forward current, thereby reducing the power dissipation, compared to the NiO/β-Ga2O3 diode without an a-BN IL. It is also found that the a-BN IL reduces the interface states, leading to the improvement of the operational reliability after bias stress and reverse blocking characteristics.
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D. G. Kim
Korea Advanced Institute of Science and Technology
Jongsu Baek
Korea Advanced Institute of Science and Technology
Daewon Kang
Electronics and Telecommunications Research Institute
Applied Physics Letters
Korea Advanced Institute of Science and Technology
Korea Electrotechnology Research Institute
Korea Aerospace University
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Kim et al. (Mon,) studied this question.
synapsesocial.com/papers/69df2b85e4eeef8a2a6b06fc — DOI: https://doi.org/10.1063/5.0321156
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