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The use of boundary-scan, as specified in IEEE 1149.1-1990, has always been considered a source of major benefits for the production test process. However, there are many existing and potential applications of boundary-scan during other life cycle phases of a product/spl minus/the design phase and field operation and support phase. This paper focuses on these additional phases of boundary-scan application.>
R.M. Sedmark (Tue,) studied this question.
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