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The use of boundary-scan, as specified in IEEE 1149.1-1990, has always been considered a source of major benefits for the production test process. However, there are many existing and potential applications of boundary-scan during other life cycle phases of a product/spl minus/the design phase and field operation and support phase. This paper focuses on these additional phases of boundary-scan application.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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R.M. Sedmark (2002) studied this question.