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January 1, 1996IEEE Software378 citations

The combinatorial design approach to automatic test generation

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DCDavid CohenSDSiddhartha R. DalalJPJesse M. Parelius

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Abstract

The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.

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Cite This Study

Cohen et al. (1996) studied this question.

synapsesocial.com/papers/6a16086e72dd1b03406b4a01https://doi.org/10.1109/52.536462
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