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Self-scanned image sensors are making possible new types of television cameras and imaging devices based entirely upon solid-state components. Research on integrated image sensors has followed two experimental approaches: monolithic silicon and thin-film photoconductors. This article reviews the operation of the most common types of self-scanned sensors, indicating their relative advantages and disadvantages. Two new developments are a 256 × 256 element photoconductive sensor with integrated thin-film scanning decoders and a novel silicon photodiode sensor that may permit considerable reduction in element spacings.
Weimer et al. (1969) studied this question.