This paper presents what we believe to be a novel theoretical framework for analyzing two-dimensional (2D) diffraction phenomena using biquaternions. We introduce a rigorous mathematical development of the 2D integral theorem of Helmholtz and Kirchhoff, the 2D biquaternionic Fresnel-Kirchhoff diffraction formula, and the 2D biquaternionic Rayleigh-Sommerfeld diffraction formula. The proposed approach offers several advantages over traditional methods, including a more concise and elegant representation of the diffraction process.
Rosa et al. (Thu,) studied this question.
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