Modern electronic devices are naturally exposed to radiative environments, particularly in aerospace and avionics applications. This radiation is a major challenge, as it can lead to breakdowns and long-term degradation of electronic components. It comes from galactic cosmic rays (GCRs), the Sun and the Earth’s radiation belts. They give rise to three main families of malfunctions: Total Ionizing Dose (TID), Displacement Damage (DD) and Single Event Effects (SEEs). SEEs, in particular Single Event Upsets (SEUs), are of particular concern, as a single particle can alter the information in a memory bit, leading to critical errors. Monte Carlo simulations are widely used to predict and mitigate these effects. These probabilistic methods can be used to estimate SEU rates and develop hardening strategies. Monte Carlo predictive tools simulate the interaction of particles with electronic devices to assess their vulnerability. Although Monte Carlo simulations have their limitations, particularly in modeling sensitive volumes and nuclear interactions, they remain essential for the aerospace and automotive industries. With the miniaturization of components, susceptibility to SEUs is increasing, underlining the need to improve these prediction tools and to pursue research into the reliability of components exposed to radiation.
F. Wrobel (Wed,) studied this question.