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September 10, 2025

Spin Squeezing in Electron Microscopy

SHS HaimTel Aviv Sourasky Medical Center ENEthan NussinsonTechnion – Israel Institute of Technology RBRoni Ben-MaimonWeizmann Institute of Science

Puntos clave

Spin squeezing improves the signal-to-noise ratio in electron microscopy, leading to enhanced imaging quality.
The technique addresses the limitations of electron-induced sample damage, offering a new approach to microscopy.
Electron interferometry can benefit from quantum metrology principles through the application of spin squeezing.
This method may significantly lower the noise levels while examining delicate samples in electron microscopy.

Resumen

We propose the concept of spin squeezing for electron interferometry, which offers a robust pathway toward quantum metrology in electron microscopy, promising to overcome the signal-to-noise ratio limit imposed by the electron-induced sample damage.

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Cite This Study

Haim et al. (Wed,) studied this question.

synapsesocial.com/papers/68c19f9c54b1d3bfb60db32b https://doi.org/https://doi.org/10.1364/quantum.2025.qtu4c.4

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