Research and development of design models for digital information processing chips

It is shown that the modern level of integrated technology for creating microelectronic products of high complexity requires an urgent solution to the problem of building a high-performance subsystem for diagnosing designed products, covering all stages of verification and control. The main purpose of the study is to carry out preparatory work for the further development of a high-performance interactive diagnostic subsystem and its integration into CAD. The main task is to select and justify the structure of software tools for generating tests of complex digital systems with the development of linguistic tools. Verification of design objects and classes of faults are considered: irregularities of logic elements and malfunctions of logic circuits. The process of fault modeling is described. The procedures for evaluating test scores are considered. A table of indicators has been compiled and algorithms for accelerated modeling of irregularities have been developed. The analysis of the principles of setting tasks for the diagnosis and control of high-complexity electronic equipment products manufactured using bipolar technology is carried out, on the basis of which the principles of building a subsystem of logical diagnostics as part of a system of top-down and bottom-up logical design of integrated CAD electronic products are identified. The requirements have been developed, which must be met by diagnostic subsystems in the context of designing electronic products of increased complexity under time constraints. The analysis of the features of building a software and technical subsystem for diagnostic diagnostics of design objects based on a number of microcomputers of the Electronics family is carried out.