Investigation of interfacial charge-carrier dynamics, degradation, and recombination mechanisms in single-junction perovskite solar cells with NiO x and SAM hole-transporting layers via steady-state drift-diffusion model simulations

Puntos clave

• The research aims to examine the charge-carrier dynamics and degradation pathways in perovskite solar cells.
• Used steady-state drift-diffusion model simulations
• Evaluated four types of hole-transporting layers
• Analyzed effects of nickel oxide and copper-doped layers
• Investigated self-assembled monolayers in conjunction with NiO
• Identified distinct degradation pathways for each type of HTL
• Found that charge-carrier dynamics vary significantly with different HTLs
• Demonstrated improvement in stability with optimized hole-transporting layers