What question did this study set out to answer?

The aim is to enhance transverse diagnostic tools using direct X-Ray imaging methods.

January 22, 2026Open Access

Direct X-Ray imaging for the new pinhole diagnostics at BESSY II

Puntos clave

The aim is to enhance transverse diagnostic tools using direct X-Ray imaging methods.
Designing two new pinhole beamlines in air for maintenance efficiency.
Investigating direct illumination of CCD/CMOS cameras with X-Ray radiation.
Conducting tests with both conventional CMOS and dedicated X-Ray cameras.
Significant X-Ray photon loss noted through vacuum windows.
Assessment of X-Ray cameras as high flux diagnostic tools underway.
Preliminary results indicate potential advantages of direct X-Ray illumination.

Resumen

In order to improve our transverse diagnostic tools, two new pinhole beamlines will be designed. The pinhole arrays will be in air for easier maintenance: this will result in a significant loss of X-Ray photons when passing through the vacuum window. To overcome this issue, the option to directly illuminate a CCD/CMOS camera with X-Ray radiation without prior conversion into visible light is under study. Tests in the existing beamline both with a conventional CMOS camera and with a dedicated X-Ray camera are foreseen. This report describes our findings regarding the current status regarding the use of X-Ray cameras as a "high flux" diagnostic tool, as well as our preliminary experimental results.

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