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Structured LLM-based patent comparison across three evaluation dimensions | Synapse
March 3, 2026
Structured LLM-based patent comparison across three evaluation dimensions
DC
D. C. Choi
Samsung (South Korea)
BP
Boeun Park
Yonsei University
Puntos clave
This structured patent comparison identifies key differences in technology sectors and innovation rates, offering valuable insights.
The algorithm enables a detailed evaluation across three dimensions: scope, originality, and impact, enhancing comprehension of patent landscapes.
Assessment using structured techniques across various patents demonstrates how evaluation methods can vary significantly in effectiveness.
Highlights the need for advanced patent analysis tools to effectively assess innovation in a rapidly evolving market.
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Choi et al. (Wed,) studied this question.
synapsesocial.com/papers/69a75cb9c6e9836116a25d8c
https://doi.org/https://doi.org/10.1016/j.wpi.2026.102430
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