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Ultra-smooth surface of RB-SiC generated by a piezo-Fenton chemical mechanical polishing with high material removal rate | Synapse
March 3, 2026
Ultra-smooth surface of RB-SiC generated by a piezo-Fenton chemical mechanical polishing with high material removal rate
HL
Haoran Liu
University of Shanghai for Science and Technology
YZ
Yikai Zang
ZW
Zhi Wang
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Puntos clave
An ultra-smooth surface finish was achieved, resulting in significant material removal rates.
The polishing process utilized a piezo-Fenton method, enhancing efficiency compared to traditional techniques.
Assessment focused on the surface characteristics of silicon carbide (SiC) produced through the process.
These findings highlight potential advances in surface treatment technologies for semiconductor materials.
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Liu et al. (Thu,) studied this question.
synapsesocial.com/papers/69a75dffc6e9836116a28547
https://doi.org/https://doi.org/10.1016/j.jmatprotec.2026.119235