Integrated fluorescence light microscopy-guided cryo-focused ion beam-milling for in situ montage cryo-ET

Puntos clave

• Enhanced imaging quality for cryo-electron tomography was achieved.
• The technique integrates fluorescence microscopy with cryo-focused ion beam milling to improve outcomes in sample preparation.
• The approach involves in situ montage and targeting specific areas of the specimen using fluorescence guidance.
• This methodology could highlight limitations in current imaging techniques, emphasizing the need for improved sample processing methods.