In-situ synchrotron X-ray diffraction investigation of microstructure evolution in Cr-doped cemented carbide during high-temperature creep deformation

Puntos clave

• Microstructure evolution occurs during high-temperature creep deformation, impacting mechanical properties.
• Key evidence includes significant changes observed in diffraction patterns at elevated temperatures.
• Analysis using in-situ synchrotron x-ray diffraction allows for real-time monitoring of microstructural changes.
• Findings highlight the importance of chromium doping in enhancing the material's performance under stress.