Electron beam-induced synthesis of defect-containing ZIF-8 for enhanced photocatalytic reduction performance

Puntos clave

• Enhanced photocatalytic reduction performance was observed with defect-containing ZIF-8.
• Photocatalytic efficiency increased by 30% under electron beam-induced synthesis, showcasing the effect of defects.
• Synthesis was achieved through electron beam irradiation that created specific defects in ZIF-8.
• These results highlight the potential for improving photocatalytic materials through defect engineering.