Near-field analysis of dipole emission near an all-dielectric metasurface by means of dual-tip scanning near-field optical microscopy

Puntos clave

• Dipole emission characteristics near the metasurface are revealed, offering insights into optical behavior.
• Key measurements show unique interactions at the nanometer scale under specific conditions.
• Analysis using dual-tip scanning near-field optical microscopy captures detailed near-field phenomena.
• Potential implications include advancements in optical devices and imaging technology applications.