• SPR sensor using Kretschmann config, FEM analysis, and TM-polarized 633 nm light. • Multilayer BK7/Ag/BaTiO₃/graphene structure detects healthy vs. cancerous cells. • Sensitivity of 266.67°/RIU with high FOM, label-free, real-time nanofab potential. This Simulation study investigates an ultrasensitive Surface Plasmon Resonance (SPR) sensor device with the Kretschmann configuration and angular interrogation technique. The analysis uses the Finite Element Method with a Transverse Magnetic - polarized plane wave light source at a visible range of 633 nm wavelength. The implemented device structure is made of high refractive index glass prism with BK 7 followed by 60 nm of silver thin film as plasmonic layer, 9 nm Barium titanate is as dielectric booster layer is incorporated, and both tried with and without the 2D material such as graphene layer. The purpose of this design is to enhance the cervical cancer detection based on targeting refractive index values for healthy cells of 1.368 and for disease cells of 1.392 for the analyte. The sensor reached a high Sensitivity of 266.67 ∘ /RIU along with other parameter metrics such as Full Width at Half Maximum, Figure of Merit, Detection Accuracy, Quality Factor, and Limit of Detection are 3.2 ∘ , 83.3 RIU −1 , 0.313, 83.47 RIU −1 , and 0.0038 RIU respectively. Moreover, the SPR sensor can detect the cervical cancer for real time monitoring without labeling demonstrates that can be virtually perform as an SPR chip by using with suitable nanofabrication techniques.
M et al. (Sun,) studied this question.