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Abstract The lengthened ion pathway in restacked 2D materials greatly limits the electrochemical performance of practically dense film electrodes (mass loading >10 mg cm −2 ). Typical strategies such as the insertion of nanomaterials and 3D‐structure design is expected to reduce the volumetric capacitance of Ti 3 C 2 T x electrodes, diminishing the dominating advantage of Ti 3 C 2 T x over other electrode materials. Here, a novel, facile, and controllable H 2 SO 4 oxidation method is developed for alleviating the restacking issue of Ti 3 C 2 T x film with few electrochemically inactive side‐products such as TiO 2 . A hierarchical ion path “highway” in Ti 3 C 2 T x film is fabricated with porous structure, atomic‐level increased interlayer spacing, and reduced flake size (through probe‐sonication). As a result, ultra‐high rate performance is obtained with high volumetric capacitance. For a ≈1.1 µm thick Ti 3 C 2 T x film, capacitance retention of 64% is obtained (208 F g −1 /756 F cm −3 ) when the scan rate is increased from 5 to 10,000 mV s −1 . Even at higher mass loadings exceeding 12 mg cm −2 (48 µm thickness), the rate capability is still comparable to unoptimized Ti 3 C 2 T x electrodes with low mass loading (1 mg cm −2 ). Consequently, a high areal capacitance of ≈3.2 F cm −2 is achieved for pathway‐optimized thick Ti 3 C 2 T x film, which is of great significance for practical applications.
Tang et al. (Sun,) studied this question.
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