Highly In‐Plane Anisotropic 2D GeAs2 for Polarization‐Sensitive Photodetection

Due to the intriguing anisotropic optical and electrical properties, low-symmetry 2D materials are attracting a lot of interest both for fundamental studies and fabricating novel electronic and optoelectronic devices. Identifying new promising low-symmetry 2D materials will be rewarding toward the evolution of nanoelectronics and nano-optoelectronics. In this work, germanium diarsenide (GeAs2 ), a group IV-V semiconductor with novel low-symmetry puckered structure, is introduced as a favorable highly anisotropic 2D material into the rapidly growing 2D family. The structural, vibrational, electrical, and optical in-plane anisotropy of GeAs2 is systematically investigated both theoretically and experimentally, combined with thickness-dependent studies. Polarization-sensitive photodetectors based on few-layer GeAs2 exhibit highly anisotropic photodetection behavior with lineally dichroic ratio up to ≈2. This work on GeAs2 will excite interests in the less exploited regime of group IV-V compounds.