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This paper presents two cryogenic low-noise amplifiers (LNAs) based on the WIN’s 0.18 μm gate length gallium arsenide (GaAs) pseudomorphic high electron mobility transistor (pHEMT) process designed for radio telescope receivers. Discrete transistors with gate peripheries spanning 50–600 μm were DC-characterized at 290 K and 15 K, respectively. The LNAs underwent on-chip noise characterization under 15 K using a Y-factor measurement setup, which integrated a calibrated noise source and a noise figure analyzer. This approach directly quantified the noise temperature—critical metrics for radio telescope receiver front-ends. The top-performing LNA variant identified through on-chip characterization was packaged and evaluated in a cryogenic test-bed. This LNA, spanning a bandwidth of 0.3–15 GHz, demonstrated a gain of 26 dB and a minimum noise temperature of 6 K when operated at an ambient temperature of 15 K. In contrast, a second LNA architecture, tested solely on-chip, demonstrated a gain of 30 dB and a minimum noise temperature of 15 K across the 0.3–7 GHz range.
Wang et al. (Sun,) studied this question.