© 2026 IEEE. Personal use of this material is permitted. This is the author‑accepted manuscript (AAM) of a paper accepted for publication in IEEE Transactions on Instrumentation and Measurement. The final Version of Record is available at https://doi.org/10.1109/tim.2026.3684656 , Wei Zhao (wei.zhao@ieee.org)
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Wei et al. (Thu,) studied this question.
synapsesocial.com/papers/69fd7f4fbfa21ec5bbf07bd2 — DOI: https://doi.org/10.5281/zenodo.19659945
Zhao Wei
VSL Dutch Metrology Institute
李传生 Li Chuansheng
National Institute of Metrology
Jari Hällström
VTT Technical Research Centre of Finland
University of Twente
VTT Technical Research Centre of Finland
Istituto Nazionale di Ricerca Metrologica
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