Early and non-destructive identification of fungal contamination in cereals is essential to support post-harvest management, reduce economic losses, and mitigate food safety risks along the wheat supply chain. Among filamentous fungi, Alternaria spp. are widespread contaminants of durum wheat and producers of toxic secondary metabolites such as alternariol (AOH), whose early detection remains analytically challenging. The aim of this study was to evaluate the potential of near-infrared transmittance (NIT) spectroscopy as a rapid, non-destructive pre-screening tool for the early identification of Alternaria-contaminated durum wheat lots and associated AOH risk. Samples from three durum wheat cultivars were artificially inoculated with Alternaria spp. and monitored over time. NIT spectra (570–1100 nm) were acquired in transmittance mode and analyzed using partial least squares (PLS) regression, focusing on the 870–1100 nm spectral region. Clear and time-dependent spectral differences were observed between inoculated and control samples, with the strongest discriminative features at 834 and 966 nm. Classification performance was high, with area under the curve (AUC) values between 0.96 and 0.97. ELISA analysis confirmed progressive AOH accumulation in inoculated kernels, consistent with the observed spectral changes, while control experiments excluded autoclaving and visual grain damage as confounding factors. From an applied perspective, the results indicate that NIT spectroscopy can support post-harvest decision-making as a rapid pre-screening approach, enabling the prioritization of suspect wheat lots for confirmatory analytical testing. Multivariate analysis further confirmed the consistency of spectral differences across datasets.
Cammerata et al. (Sun,) studied this question.