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Testbeds are indispensable for debugging and evaluating wireless embedded systems. While existing testbeds provide ample opportunities for realistic, large-scale experiments, they are limited in their ability to closely observe and control the distributed operation of resource-constrained nodes - access to the nodes is restricted to the serial port. This paper presents FlockLab, a testbed that overcomes this limitation by allowing multiple services to run simultaneously and synchronously against all nodes under test in addition to the traditional serial port service: tracing of GPIO pins to record logical events occurring on a node, actuation of GPIO pins to trigger actions on a node, and high-resolution power profiling. FlockLab's accurate timing information in the low microsecond range enables logical events to be correlated with power samples, thus providing a previously unattained level of visibility into the distributed behavior of wireless embedded systems. In this paper, we describe FlockLab's design, benchmark its performance, and demonstrate its capabilities through several real-world test cases.
Lim et al. (Mon,) studied this question.
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