Automated di/dt stressmark generation for microprocessor power delivery networks

Abstract — In this paper, we propose a method for automated di/dt stressmark generation to test maximum voltage droop in a microprocessor power delivery network. The di/dt stressmark is an instruction sequence which draws periodic high and low current pulses that maximize voltage fluctuations including voltage droops. In order to automate di/dt stressmark generation, we devise a code generator with the ability to control instruction sequencing, register assignments, and dependencies. Our framework uses a Genetic Algorithm in scheduling and optimizing candidate instruction sequences to create a maximum voltage droop. The results show that our automatically generated di/dt stressmarks achieved more than 40 % average increase in voltage droop compared to hand-coded di/dt stressmarks and typical benchmarks in experiments covering three microprocessor architectures and five power delivery network (PDN) models. Additionally, our method considers all the units in a microprocessor, as opposed to a previous ILP scheduling method that handles only execution units.