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A 0.25 /spl mu/m generation logic technology has been developed with high performance transistors and five layers of planarized interconnect. The transistors are optimized for 1.8 V operation to provide high performance, low power and good reliability. The interconnects feature extensive use of planarization and high aspect ratio metal lines. 4 Mbit SRAMs with a 10.26 /spl mu/m/sup 2/ 6-T cell size have been built on this technology.
Bohr et al. (Mon,) studied this question.