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A new delay generator based on a series of coupled ring oscillators has been developed; it produces precise delays with subgate delay resolution for chip testing applications. It achieves a delay resolution equal to a buffer delay divided by the number of rings. The coupling employed forces the outputs of a linear array of ring oscillators oscillating at the same frequency to be uniformly offset in phase by a precise fraction of a buffer delay. The buffer stage used in the ring oscillators is based on a source-coupled pair and achieves high supply noise rejection while operating at low supply voltages. Experimental results from a 2- mu m N-well CMOS implementation of the delay generator demonstrate that it can achieve an output delay resolution of 101 ps while operating at 141 MHz with a peak error of 58 ps.>
Maneatis et al. (Fri,) studied this question.