Los puntos clave no están disponibles para este artículo en este momento.
We describe technology developed to improve the emission efficiency of our aluminum nitride (AlN) deep-ultraviolet light-emitting diode, which has a wavelength of 20 nm: the shortest wavelength ever observed from any semiconductor.The improvement utilizes the unique characteristic that the emission intensity greatly changes depending on the crystal plane of the emitting surface.
Taniyasu et al. (Sun,) studied this question.