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Abstract A method to fit Compton profiles in x‐ray fluorescence (XRF) spectroscopy using a line shape calculated from first principles is proposed. The fitting procedure incorporates the Compton profile calculations and the double Compton scattering line shape algorithm. The results demonstrate the effectiveness of the fitting approach in accurately describing the measured scattering spectra, with good agreement observed between the fit and experimental data. The findings of this study can be used for more accurate characterization of the scattering peaks in XRF spectroscopy.
Tee et al. (Fri,) studied this question.