Structural and dielectric modulation of NiTiO3 thin films deposited by pulsed spray pyrolysis technique via post-annealing

Key Points

• Improved dielectric properties were recorded for NiTiO3 thin films after post-annealing, enhancing performance and stability.
• The dielectric constant significantly increased to 400 at 1 kHz after annealing, compared to untreated films.
• Analysis involved pulsed spray pyrolysis to create thin films, followed by various annealing temperatures to assess structural impacts.
• These findings highlight the potential for enhanced electronic device applications using optimized NiTiO3 thin films under controlled processing conditions.