Microstructure and phase state of silicon carbide irradiated with helium ions | Synapse
March 3, 2026Open Access
Microstructure and phase state of silicon carbide irradiated with helium ions
Key Points
Irradiation alters the phase state of silicon carbide, impacting its structural integrity and performance.
X-ray diffraction analysis reveals distinct changes in crystal structure post-irradiation, with notable shifts observed.
Assessment using atomic force microscopy highlights surface morphology variations indicative of structural modification.
Findings may enable better understanding of material behaviors in nuclear and space applications, emphasizing practical implications.
Abstract
The structural and phase state of the initial and irradiated silicon carbide samples was studied by X-ray diffraction analysis (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM).