Generated Pattern Current for Semiconductor Device Conditioning: Temporal Current Structuring for Trap Management and Threshold Voltage Stabilization

Key Points

• The aim is to explore how generated pattern current (GPC) enhances semiconductor device conditioning.
• Utilized generated pattern current (GPC) for conditioning semiconductors.
• Focused on SiC MOSFETs and resistive-switching elements.
• Assessed impacts on trap passivation and voltage stabilization.
• Effective trap management was observed using GPC.
• Threshold voltage stabilization improved significantly.
• Demonstrated potential for enhanced performance in semiconductor devices.

Abstract