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January 3, 2006Physical Review Letters2,466 citationsOpen Access

Quantum Metrology

VGVittorio GiovannettiScuola Normale SuperioreSLSeth LloydUniversity of Southern CaliforniaLMLorenzo MacconeUniversity of Pavia

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Abstract

We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.

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Cite This Study

Giovannetti et al. (2006) studied this question.

synapsesocial.com/papers/69d9e5380f32475823a3ca11https://doi.org/10.1103/physrevlett.96.010401
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