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Some new developments are reported in the technique of observing magnetization in thin ferromagnetic films by transmission electron microscopy, and the results of some observations are described that contribute to an understanding of the magnetic character of thin films. Two modes of operation of a microscope are explained, one using projector magnification alone, and one using both objective and projector lenses. The intensity distribution images of the magnetization distribution in a thin film is derived from the Lorentz force acting on an electron passing through the film. The intensity distributions for some simple domain walls are computed and compared in various ways with experimental observations. A magnetization ripple model is proposed and justified to explain an intensity texture observed principally when projector magnification alone is used. The texture is shown to be an orthogonal map of the magnetization of the film, and to be of use in interpreting wall structures. High magnification and resolution wall micrographs are obtained using objective magnification, and a direct measurement of the wall thickness and shape can be made in this way. 180° walls in a Fe-Ni alloy film of about 200 A thickness are found to have a width of 2δ = 1500 A, using the wall model cot−1θ = −sinhx/δ. The effect of finite resolution on the measurements is discussed. It is shown that the magnetization distribution of a wall can be obtained from the measured intensity distribution by inverting the parametric equation solution for the intensity distribution.
Fuller et al. (Mon,) studied this question.