ABSTRACT The linear and third‐order nonlinear optical response of thin‐films of the transition metal dichalcogenide hafnium disulfide (HfS 2 ) is investigated. Varying angle spectroscopic ellipsometry measurements are performed to obtain the material's in‐plane and out‐of‐plane refractive indices in the – wavelength range. HfS 2 is found to exhibit a strong, highly anisotropic linear optical response. In particular, it is shown that the material's in‐plane refractive index exceeds a value of 3 throughout the visible wavelength range, while simultaneously offering a remarkably wide transparency window with for . The absolute value of the in‐plane third‐order nonlinear susceptibility is derived from third‐harmonic generation (THG) measurements for fundamental wavelengths of to and is found to range from to , respectively. The obtained values significantly exceed those of conventional high‐index materials, such as silicon or gallium phosphide. Furthermore, the efficiency of the THG process is found to be controllable by varying both the film thickness and the dielectric environment. These findings establish HfS 2 as a highly promising candidate for nonlinear optical applications, surpassing the performance of conventional high‐index materials.
Laudert et al. (Tue,) studied this question.