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A ferroelectric-like hysteresis loop is obtained for a nonferroelectric system consisting of two back-to-back metal-semiconductor Schottky contacts with a large concentration of traps distributed over a finite thickness near the electrodes. The presented results show that a simple hysteresis loop measured at a single frequency is not always solid evidence of ferroelectricity in low-dimensional structures such as thin films or nanoscale structures.
Pintilie et al. (Thu,) studied this question.
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