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Scanning tunneling microscopy is a powerful tool for the study of surface structure. Information can be obtained by examining real-space structure within unit cells and by determining the registration of features relative to the positions of the bulk lattice. Techniques for image enhancement, distortion correction, and registration determination are described and illustrated for structural studies of the ((3)1/2×(3)1/2)R30° Ag/Si(111) surface.
Wilson et al. (Tue,) studied this question.