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The line broadening in electron diffraction powder patterns from evaporated nickel films has been investigated. The pure diffraction broadening was found to vary with the Bragg angle in agreement with a microstress theory of broadening rather than with a particle size mechanism. The Fourier transform of the pure diffraction broadening has been determined and also found to be in agreement with a microstress mechanism.
E.K. Halteman (1952) studied this question.