Elmos Semiconductor (Germany)

Recent papers from Elmos Semiconductor (Germany)

1. Yield prediction in semiconductor manufacturing using two-step machine learningInternational Journal of Production Research · 2025
2. Silver Bonding Wire - an Alternative for Mechanical Sensitive Chip Configurations in Automotive Electronics PackagingIMAPSource Proceedings · 2024
3. Can the adenosine triphosphate (ATP) bioluminescence assay be used as an indicator for hospital cleaning? – A pilot studyGMS. Hygiene and infection control · 2024
4. Digit-DM: A Sustainable Data Mining Modell for Continuous Digitization in Manufacturing2023
5. Validity of Two Consumer Multisport Activity Tracker and One Accelerometer against Polysomnography for Measuring Sleep Parameters and Vital Data in a Laboratory Setting in Sleep PatientsSensors · 2022
6. Heart Rate and Distance Measurement of Two Multisport Activity Trackers and a Cellphone App in Different Sports: A Cross-Sectional Validation and Comparison Field StudySHILAP Revista de lepidopterología · 2021
7. Multi-Volume Data Visualization Using Bounding Shells2021
8. 3D Shape Modeling Using Perturbation Functions2021
9. Isotropic Scalar Quantum Sensing of Magnetic Fields for Industrial ApplicationAdvanced Quantum Technologies · 2020
10. Correlation between sputter deposition parameters and I-V characteristics in double-barrier memristive devicesJournal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2019
11. Implanted upper airway stimulation device for obstructive sleep apneaThe Laryngoscope · 2012
12. Effects of Synchronous Demodulation in Vibratory MEMS Gyroscopes: A Theoretical StudyIEEE Sensors Journal · 2008
13. High‐resolution continuous‐time interface for micromachined capacitive accelerometerInternational Journal of Circuit Theory and Applications · 2008
14. Light Source Position Measurement Technique Applicable in SOI TechnologyIEEE Journal of Solid-State Circuits · 2008
15. TDDB Data Generation for Fast Lifetime Projections Based on V-Ramp Stress DataIEEE Transactions on Device and Materials Reliability · 2007